Travelled to:
1 × Canada
Collaborated with:
B.Muralikrishnan J.Raja
Talks about:
metrolog (1) function (1) process (1) cluster (1) surfac (1) correl (1) applic (1) novel (1) map (1)
Person: K. Najarian
DBLP: Najarian:K=
Contributed to:
Wrote 1 papers:
- ICPR-v1-2002-MuralikrishnanNR #clustering #correlation #functional #novel #process
- Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application (BM, KN, JR), pp. 29–32.