Daniel Toth, Alexandru Condurache, Til Aach
A Two-Stage-Classifier for Defect Classification in Optical Media Inspection
ICPR, 2002.
@inproceedings{ICPR-v4-2002-TothCA,
author = "Daniel Toth and Alexandru Condurache and Til Aach",
booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 4}",
doi = "10.1109/ICPR.2002.1047473",
isbn = "0-7695-1695-5",
pages = "373--376",
publisher = "{IEEE Computer Society}",
title = "{A Two-Stage-Classifier for Defect Classification in Optical Media Inspection}",
year = 2002,
}











