Shih-Feng Sun, Andy Podgurski
Properties of Effective Metrics for Coverage-Based Statistical Fault Localization
ICST, 2016.
@inproceedings{ICST-2016-SunP,
author = "Shih-Feng Sun and Andy Podgurski",
booktitle = "{Proceedings of the Ninth International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2016.31",
isbn = "978-1-5090-1827-7",
pages = "124--134",
publisher = "{IEEE Computer Society}",
title = "{Properties of Effective Metrics for Coverage-Based Statistical Fault Localization}",
year = 2016,
}
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