Properties of Effective Metrics for Coverage-Based Statistical Fault Localization
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Shih-Feng Sun, Andy Podgurski
Properties of Effective Metrics for Coverage-Based Statistical Fault Localization
ICST, 2016.

ICST 2016
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@inproceedings{ICST-2016-SunP,
	author        = "Shih-Feng Sun and Andy Podgurski",
	booktitle     = "{Proceedings of the Ninth International Conference on Software Testing, Verification and Validation}",
	doi           = "10.1109/ICST.2016.31",
	isbn          = "978-1-5090-1827-7",
	pages         = "124--134",
	publisher     = "{IEEE Computer Society}",
	title         = "{Properties of Effective Metrics for Coverage-Based Statistical Fault Localization}",
	year          = 2016,
}

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