Rebekka Alm, Sven Kiehl, Birger Lantow, Kurt Sandkuhl
Applicability of Quality Metrics for Ontologies on Ontology Design Patterns
KEOD, 2013.
@inproceedings{KEOD-2013-AlmKLS,
author = "Rebekka Alm and Sven Kiehl and Birger Lantow and Kurt Sandkuhl",
booktitle = "{Proceedings of the Fifth International Conference on Knowledge Engineering and Ontology Development}",
doi = "10.5220/0004541400480057",
isbn = "978-989-8565-81-5",
pages = "48--57",
publisher = "{SciTePress}",
title = "{Applicability of Quality Metrics for Ontologies on Ontology Design Patterns}",
year = 2013,
}











