Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn’t matter
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Nitin Saxena, C. Seshadhri
Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn’t matter
STOC, 2011.

STOC 2011
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@inproceedings{STOC-2011-SaxenaS,
	author        = "Nitin Saxena and C. Seshadhri",
	booktitle     = "{Proceedings of the 43rd Annual ACM Symposium on Theory of Computing}",
	doi           = "10.1145/1993636.1993694",
	isbn          = "978-1-4503-0691-1",
	pages         = "431--440",
	publisher     = "{ACM}",
	title         = "{Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn’t matter}",
	year          = 2011,
}

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