Victor Sobreira, Marcelo de Almeida Maia
A Visual Trace Analysis Tool for Understanding Feature Scattering
WCRE, 2008.
@inproceedings{WCRE-2008-SobreiraM,
author = "Victor Sobreira and Marcelo de Almeida Maia",
booktitle = "{Proceedings of the 15th Working Conference on Reverse Engineering}",
doi = "10.1109/WCRE.2008.40",
editor = "Ahmed E. Hassan and Andy Zaidman and Massimiliano Di Penta",
pages = "337--338",
publisher = "{IEEE}",
title = "{A Visual Trace Analysis Tool for Understanding Feature Scattering}",
year = 2008,
}











