Travelled to:
1 × USA
Collaborated with:
P.Gupta
Talks about:
mask (2) fractur (1) reduct (1) effect (1) model (1) cost (1) base (1)
Person: Abde Ali Kagalwalla
DBLP: Kagalwalla:Abde_Ali
Contributed to:
Wrote 1 papers:
- DAC-2015-KagalwallaG #effectiveness #modelling #reduction
- Effective model-based mask fracturing for mask cost reduction (AAK, PG), p. 6.