Stem mask$ (all stems)

78 papers:

DAC-2015-BadrTG #hybrid #synthesis

Mask assignment and synthesis of DSA-MP hybrid lithography for sub-7nm contacts/vias (YB, AT, PG), p. 6.

DAC-2015-DingCZ #algorithm #invariant #performance

An efficient shift invariant rasterization algorithm for all-angle mask patterns in ILT (YD, CCNC, XZ), p. 6.

DAC-2015-KagalwallaG #effectiveness #modelling #reduction

Effective model-based mask fracturing for mask cost reduction (AAK, PG), p. 6.

DAC-2015-SuC #complexity

Nanowire-aware routing considering high cut mask complexity (YHS, YWC), p. 6.

DATE-2015-0001CY #approach #optimisation #process #robust

A robust approach for process variation aware mask optimization (JK, WKC, EFYY), pp. 1591–1594.

DATE-2015-KriebelRSASH #analysis #combinator #configuration management #fault #named #performance

ACSEM: accuracy-configurable fast soft error masking analysis in combinatorial circuits (FK, SR, DS, PVA, MS, JH), pp. 824–829.

TACAS-2015-DemasiCRMA #fault tolerance #named #source code #specification

syntMaskFT: A Tool for Synthesizing Masking Fault-Tolerant Programs from Deontic Specifications (RD, PFC, NR, TSEM, NA), pp. 188–193.

ICML-2015-GermainGML #estimation #named

MADE: Masked Autoencoder for Distribution Estimation (MG, KG, IM, HL), pp. 881–889.

DAC-2014-EldibWTS #named #source code

QMS: Evaluating the Side-Channel Resistance of Masked Software from Source Code (HE, CW, MMIT, PS), p. 6.

DAC-2014-GaoXYP #named #optimisation #process

MOSAIC: Mask Optimizing Solution With Process Window Aware Inverse Correction (JRG, XX, BY, DZP), p. 6.

DATE-2014-ChienPWWLWW #cost analysis

Mask-cost-aware ECO routing∗ (HAC, ZYP, YRW, THW, HCL, CFW, TCW), pp. 1–4.

ICPR-2014-McCloskey

Masking Light Fields to Remove Partial Occlusion (SM), pp. 2053–2058.

CAV-2014-EldibW #synthesis

Synthesis of Masking Countermeasures against Side Channel Attacks (HE, CW), pp. 114–130.

DAC-2013-ShafiqueRAH #fault #optimisation #reliability

Exploiting program-level masking and error propagation for constrained reliability optimization (MS, SR, PVA, JH), p. 9.

DAC-2013-YuanX #fault #logic #low cost #named #scalability

InTimeFix: a low-cost and scalable technique for in-situ timing error masking in logic circuits (FY, QX), p. 6.

SIGMOD-2012-GotzNG #mobile #named #personalisation

MaskIt: privately releasing user context streams for personalized mobile applications (MG, SN, JG), pp. 289–300.

CHI-2012-BullingAS #security #using #visual notation

Increasing the security of gaze-based cued-recall graphical passwords using saliency masks (AB, FA, AS), pp. 3011–3020.

ICPR-2012-WilkinsonO #analysis #documentation

Mask-edge connectivity: Theory, computation, and application to historical document analysis (MHFW, JO), pp. 1334–1337.

KR-2012-HorridgePS #ontology

Justification Masking in Ontologies (MH, BP, US).

MoDELS-2012-NoyritGS #metamodelling #named #uml

FacadeMetamodel: Masking UML (FN, SG, BS), pp. 20–35.

MoDELS-2012-NoyritGS #metamodelling #named #uml

FacadeMetamodel: Masking UML (FN, SG, BS), pp. 20–35.

DATE-2011-LiuS #continuation #optimisation #performance

An efficient mask optimization method based on homotopy continuation technique (FL, XS), pp. 1053–1058.

DRR-2011-SmithDL #documentation

A mask-based enhancement method for historical documents (EHBS, JD, LLS), pp. 1–10.

DATE-2010-LiSBNO #analysis #implementation

Power Variance Analysis breaks a masked ASIC implementation of AES (YL, KS, LB, DN, KO), pp. 1059–1064.

DATE-2010-YeHL #fault #multi

Diagnosis of multiple arbitrary faults with mask and reinforcement effect (JY, YH, XL), pp. 885–890.

SIGMOD-2010-NabeelSZB #named #privacy

Mask: a system for privacy-preserving policy-based access to published content (MN, NS, JZ, EB), pp. 1239–1242.

ICPR-2010-GuoM #detection #using

Action Detection in Crowded Videos Using Masks (PG, ZM), pp. 1767–1770.

ICPR-2010-LiZZ #detection #invariant #using

Abandoned Objects Detection Using Double Illumination Invariant Foreground Masks (XL, CZ, DZ), pp. 436–439.

DAC-2009-Zhu #simulation

A parameterized mask model for lithography simulation (ZZ), pp. 963–968.

DATE-2009-ChoudhuryM #fault #logic

Masking timing errors on speed-paths in logic circuits (MRC, KM), pp. 87–92.

IDGD-2009-ChenCJ #case study #design

A Study of Innovation Design on Taiwan Culture Creative Product — A Case Study of the Facial Mask of Ba Ja Jang (CHC, BCC, CDJ), pp. 337–346.

POPL-2009-QiM

Masked types for sound object initialization (XQ, ACM), pp. 53–65.

DAC-2008-BrockmanLKKM #array #design #memory management #multi #programmable #using

Design of a mask-programmable memory/multiplier array using G4-FET technology (JBB, SL, PMK, AK, MMM), pp. 337–338.

DAC-2008-KrishnaswamyMH #design #logic #on the #reliability

On the role of timing masking in reliable logic circuit design (SK, ILM, JPH), pp. 924–929.

FM-2008-BonakdarpourK #bound #fault

Masking Faults While Providing Bounded-Time Phased Recovery (BB, SSK), pp. 374–389.

ICPR-2008-YiAC #invariant #kernel #using

Orientation and scale invariant mean shift using object mask-based kernel (KMY, HSA, JYC), pp. 1–4.

POPL-2008-Laud #encryption #on the

On the computational soundness of cryptographically masked flows (PL), pp. 337–348.

DAC-2007-AmbroseRP #analysis #injection #named #random

RIJID: Random Code Injection to Mask Power Analysis based Side Channel Attacks (JAA, RGR, SP), pp. 489–492.

SAC-2007-JohnsB #approximate #automation #injection #named #web

SMask: preventing injection attacks in web applications by approximating automatic data/code separation (MJ, CB), pp. 284–291.

SAC-2007-PolatD #privacy #using

Effects of inconsistently masked data using RPT on CF with privacy (HP, WD), pp. 649–653.

SAS-2006-AskarovHS

Cryptographically-Masked Flows (AA, DH, AS), pp. 353–369.

ICPR-v3-2006-Wang06a #analysis #using

Abnormal Walking Gait Analysis Using Silhouette-Masked Flow Histograms (LW0), pp. 473–476.

DAC-2005-WongKP #flexibility #multi

Flexible ASIC: shared masking for multiple media processors (JLW, FK, MP), pp. 909–914.

DAC-2004-McCullen

Phase correct routing for alternating phase shift masks (KWM), pp. 317–320.

DAC-2004-ShenoyKC #automation #design #programmable

Design automation for mask programmable fabrics (NVS, JK, RC), pp. 192–197.

DATE-2003-SaputraVKIBKZ #behaviour #encryption #energy

Masking the Energy Behavior of DES Encryption (HS, NV, MTK, MJI, RRB, SK, WZ), pp. 10084–10089.

DAC-2001-LiebmannLHG #design #logic

Enabling Alternating Phase Shifted Mask Designs for a Full Logic Gate Level: Design Rules and Design Rule Checking (LL, JL, FLH, IG), pp. 79–84.

SAC-1999-Al-OmariM #fault tolerance #using

Fault-Tolerant Routing in Hypercubes Using Masked Interval Routing Scheme (MAO, MM), pp. 481–485.

HCI-CC-1997-TakedaH #question

Does the Circadian Rhythm of VDT Operators Cause Fluctuations of CFF Value that to Mask Fatigue Variations During Work Load? (MT, YH), pp. 563–566.

ESEC-1991-Linden #specification

Specification in COLD-1 of a CAD-Package for Drawing Shadow Masks (FvdL), pp. 101–121.

DAC-1990-CarlsonR #algorithm #design #evaluation #parallel #performance #verification

Design and Performance Evaluation of New Massively Parallel VLSI Mask Verification Algorithms in JIGSAW (ECC, RAR), pp. 253–259.

DAC-1988-CarlsonR #verification

Mask Verification on the Connection Machine (ECC, RAR), pp. 134–140.

VLDB-1987-FreytagCK #database #source code

Masking System Crashes in Database Application Programs (JCF, FC, BK), pp. 407–416.

DAC-1985-Barke #finite

Resistance calculation from mask artwork data by finite element method (EB), pp. 305–311.

DAC-1984-KawamuraTH #functional #memory management #verification

Functional verification of memory circuits from mask artwork data (MK, HT, KH), pp. 228–234.

DAC-1983-TsukizoeSKF

MACH : a high-hitting pattern checker for VLSI mask data (AT, JS, TK, HF), pp. 726–731.

DAC-1982-TakashimaMCY #source code #verification

Programs for verifying circuit connectivity of mos/lsi mask artwork (MT, TM, TC, KY), pp. 544–550.

DAC-1981-KozawaTSMI #algorithm #concurrent

A concurrent pattern operation algorithm for VLSI mask data (TK, AT, JS, CM, TI), pp. 563–570.

DAC-1981-Lauther #algorithm

An O (N log N) algorithm for Boolean mask operations (UL), pp. 555–562.

DAC-1981-Wilmore #performance

Efficient Boolean operations on IC masks (JAW), pp. 571–579.

DAC-1981-YoshidaOG #named #verification

PANAMAP-B: A mask verification system for bipolar IC (JY, TO, YG), pp. 690–695.

DAC-1980-Dunlop

SLIM-the translation of symbolic layouts into mask data (AED), pp. 595–602.

DAC-1980-MitsuhashiCTY #analysis

An integrated mask artwork analysis system (TM, TC, MT, KY), pp. 277–284.

DAC-1980-Wilmore #representation

A hierarchical bit-map format for the representation of IC mask data (JAW), pp. 585–589.

DAC-1979-AkinoSKN #simulation #verification

Circuit simulation and timing verification based on MOS/LSI mask information (TA, MS, YK, TN), pp. 88–94.

DAC-1979-SatoNSY #design #layout #named

MIRAGE — a simple-model routing program for the hierarchical layout design of IC masks (KS, TN, HS, TY), pp. 297–304.

DAC-1978-Larsen #generative

Versatile mask generation techniques for custom microelectronic devices (RPL), pp. 193–198.

DAC-1978-PreasG #automation #layout

Methods for hierarchical automatic layout of custom LSI circuit masks (BP, CWG), pp. 206–212.

DAC-1978-Weste #analysis #design

A color graphics system for I.C. mask design and analysis (NW), pp. 199–205.

DAC-1977-Harlow #design #interactive

The open shop interactive mask design operation at harris semiconductor (JEHI), pp. 331–335.

DAC-1977-Larsen #effectiveness #layout

Cost effective layout digitizing and mask pen plotting of custom microelectronic devices (RPL), pp. 386–390.

DAC-1976-BuntineP #analysis #design

Design rule checking and analysis of IC mask designs (WLB, BP), pp. 301–308.

DAC-1976-PreasBG #analysis #automation

Automatic circuit analysis based on mask information (BP, WLB, CWG), pp. 309–317.

DAC-1975-Valle #layout #relational

Relational data handling techniques in integrated circuit mask layout procedures (GV), pp. 407–413.

DAC-1974-MitchellG #analysis #automation #named

MAP: A user-controlled automated Mask Analysis Program (CLM, JMG), pp. 107–118.

DAC-1971-Brinsfield #information management

Mask Shop Information System (JGB), pp. 373–377.

DAC-1970-AkersGR #layout

IC mask layout with a single conductor layer (SBA, JMG, DLR), pp. 7–16.

DAC-1970-AshleyMS #automation #metric

An automated micro measurement system for integrated circuit masks (FRA, EBM, HJS), pp. 17–27.