Travelled to:
1 × USA
Collaborated with:
M.Amoui N.Kaushik L.Tahvildari S.Li W.Liu
Talks about:
industri (1) search (1) experi (1) duplic (1) detect (1) defect (1) base (1)
Person: Abraham Al-Dabbagh
DBLP: Al-Dabbagh:Abraham
Contributed to:
Wrote 1 papers:
- MSR-2013-AmouiKATLL #detection #experience #fault #industrial #search-based
- Search-based duplicate defect detection: an industrial experience (MA, NK, AAD, LT, SL, WL), pp. 173–182.