Travelled to:1 × United Kingdom
Collaborated with:B.K.Aichernig J.Auer E.Jöbstl R.Korosec W.Krenn R.Schlick
Talks about:industri (1) measur (1) mutat (1) model (1) devic (1) test (1) base (1)
Person: Birgit Vera Schmidt
DBLP: Schmidt:Birgit_Vera
Contributed to:
2014Wrote 1 papers:
- TAP-2014-AichernigAJKKSS #industrial #metric #modelling #mutation testing #testing
- Model-Based Mutation Testing of an Industrial Measurement Device (BKA, JA, EJ, RK, WK, RS, BVS), pp. 1–19.