Travelled to:
1 × Austria
1 × United Kingdom
Collaborated with:
W.Krenn B.K.Aichernig E.Jöbstl S.Tiran H.Brandl J.Auer R.Korosec B.V.Schmidt
Talks about:
mutat (2) model (2) test (2) base (2) uml (2) industri (1) measur (1) devic (1) mut (1)
Person: Rupert Schlick
DBLP: Schlick:Rupert
Contributed to:
Wrote 2 papers:
- ICST-2015-KrennSTAJB #modelling #mutation testing #named #testing #uml
- MoMut: : UML Model-Based Mutation Testing for UML (WK, RS, ST, BKA, EJ, HB), pp. 1–8.
- TAP-2014-AichernigAJKKSS #industrial #metric #modelling #mutation testing #testing
- Model-Based Mutation Testing of an Industrial Measurement Device (BKA, JA, EJ, RK, WK, RS, BVS), pp. 1–19.