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Collaborated with:
Ying-Jen Chen J.Wu Yi-Chia Wu C.Chien
Talks about:
semiconductor (1) manufactur (1) multivari (1) classif (1) detect (1) analyt (1) fault (1) data (1) big (1)

Person: Bo-Cheng Wang

DBLP DBLP: Wang:Bo=Cheng

Contributed to:

CASE 20172017

Wrote 1 papers:

CASE-2017-ChenWWWC #big data #classification #detection #fault #multi
Big data analytic for multivariate fault detection and classification in semiconductor manufacturing (YJC, BCW, JZW, YCW, CFC), pp. 731–736.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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