Travelled to:
1 × Germany
Collaborated with:
S.Hong S.Yoo K.Choi S.Eo T.Kim
Talks about:
distribut (1) softwar (1) exploit (1) voltag (1) suppli (1) runtim (1) scale (1) dynam (1) bodi (1) bias (1)
Person: Byeong Bin
DBLP: Bin:Byeong
Contributed to:
Wrote 1 papers:
- DATE-2008-HongYBCEK #bias #runtime #scalability
- Dynamic Voltage Scaling of Supply and Body Bias Exploiting Software Runtime Distribution (SH, SY, BB, KMC, SKE, TK), pp. 242–247.