Travelled to:1 × Turkey
2 × China
Collaborated with:S.Chao Y.Tseng W.Li W.Chiu Y.Jhang C.Yen
Talks about:contrast (3) detect (3) defect (3) low (3) anisotrop (2) diffus (2) substrat (1) independ (1) general (1) analysi (1)
Person: Du-Ming Tsai
DBLP: Tsai:Du=Ming
Contributed to:
201020062006Wrote 3 papers:
- ICPR-2010-ChaoTLC #detection #fault
- A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces (SMC, DMT, WCL, WYC), pp. 4408–4411.
- ICPR-v1-2006-ChaoTTJ #detection #fault #using
- Defect detection in low-contrast glass substrates using anisotropic diffusion (SMC, DMT, YHT, YRJ), pp. 654–657.
- ICPR-v2-2006-TsaiTCY #analysis #component #design #detection #fault #image #independence
- Independent component analysis based filter design for defect detection in low-contrast textured images (DMT, YHT, SMC, CHY), pp. 231–234.