Travelled to:
1 × France
Collaborated with:
M.Hiromoto T.Sato
Talks about:
probabl (1) method (1) failur (1) effici (1) ecrips (1) calcul (1) induc (1) sram (1) cell (1) rtn (1)
Person: Hiromitsu Awano
DBLP: Awano:Hiromitsu
Contributed to:
Wrote 1 papers:
- DATE-2015-AwanoHS #named #performance #probability
- ECRIPSE: an efficient method for calculating RTN-induced failure probability of an SRAM cell (HA, MH, TS), pp. 549–554.