Travelled to:2 × USA
Collaborated with:K.Cheng S.Bhawmik C.Lin
Talks about:test (3) scan (2) bist (2) base (2) algorithm (1) qualiti (1) general (1) select (1) scheme (1) improv (1)
Person: Huan-Chih Tsai
DBLP: Tsai:Huan=Chih
Contributed to:
19991997Wrote 2 papers:
- DAC-1999-TsaiCB #quality #using
- Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme (HCT, KTC, SB), pp. 748–753.
- DAC-1997-TsaiCLB #algorithm #hybrid
- A Hybrid Algorithm for Test Point Selection for Scan-Based BIST (HCT, KTC, CJL, SB), pp. 478–483.