Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik
Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
DAC, 1999.
@inproceedings{DAC-1999-TsaiCB,
author = "Huan-Chih Tsai and Kwang-Ting Cheng and Sudipta Bhawmik",
booktitle = "{Proceedings of the 36th Design Automation Conference}",
doi = "10.1145/309847.310050",
pages = "748--753",
publisher = "{ACM Press}",
title = "{Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme}",
year = 1999,
}