Travelled to:
1 × Australia
1 × Austria
Collaborated with:
A.Visa J.Rauhamaa
Talks about:
defect (2) unsupervis (1) segment (1) classif (1) textur (1) surfac (1) shape (1) adapt (1) base (1)
Person: Jukka Iivarinen
DBLP: Iivarinen:Jukka
Contributed to:
Wrote 2 papers:
- ICPR-1998-IivarinenV #adaptation #classification #fault
- An adaptive texture and shape based defect classification (JI, AV), pp. 117–122.
- ICPR-1996-IivarinenRV #fault #segmentation
- Unsupervised segmentation of surface defects (JI, JR, AV), pp. 356–360.