Travelled to:
1 × USA
Collaborated with:
M.Ahmadi
Talks about:
fault (2) cmos (2) character (1) techniqu (1) testabl (1) circuit (1) detect (1) design (1) iddq (1)
Person: Kaamran Raahemifar
DBLP: Raahemifar:Kaamran
Contributed to:
Wrote 1 papers:
- DAC-2001-RaahemifarA #detection #fault
- Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits (KR, MA), pp. 313–316.