Travelled to:1 × France
1 × Germany
1 × New Zealand
1 × South Korea
1 × Spain
2 × USA
Collaborated with:K.Pohl S.Bühne R.Pohl T.Merten S.Bürsner S.Toehning S.Lohmann P.Heim G.Halmans A.Heuer C.J.Budnik S.Konrad
Talks about:requir (6) product (4) engin (4) line (4) model (3) check (3) variabl (2) consist (2) toward (2) domain (2)
Person: Kim Lauenroth
DBLP: Lauenroth:Kim
Contributed to:
2011
2011
20102009
2008200720062005Wrote 9 papers:
- ASE-2011-PohlLP #algorithm #analysis #automation #comparison #feature model #modelling #performance
- A performance comparison of contemporary algorithmic approaches for automated analysis operations on feature models (RP, KL, KP), pp. 313–322.
- REFSQ-2011-MertenLB #comprehension #enterprise #requirements #research #towards
- Towards a New Understanding of Small and Medium Sized Enterprises in Requirements Engineering Research (TM, KL, SB), pp. 60–65.
- SPLC-2010-HeuerBKLP #diagrams #process #semantics #syntax #variability
- Formal Definition of Syntax and Semantics for Documenting Variability in Activity Diagrams (AH, CJB, SK, KL, KP), pp. 62–76.
- ASE-2009-LauenrothPT #model checking #product line
- Model Checking of Domain Artifacts in Product Line Engineering (KL, KP, ST), pp. 269–280.
- RE-2008-LauenrothP #consistency #product line #requirements
- Dynamic Consistency Checking of Domain Requirements in Product Line Engineering (KL, KP), pp. 193–202.
- RE-2008-LohmannHL #distributed #elicitation #requirements
- Web-based Stakeholder Participation in Distributed Requirements Elicitation (SL, PH, KL), pp. 323–324.
- ASE-2007-LauenrothP #automation #consistency #product line #requirements #specification #towards
- Towards automated consistency checks of product line requirements specifications (KL, KP), pp. 373–376.
- SPL-BOOK-2006-BuhneHLP #requirements
- Scenario-Based Application Requirements Engineering (SB, GH, KL, KP), pp. 161–194.
- RE-2005-BuhneLP #modelling #product line #requirements #variability
- Modelling Requirements Variability across Product Lines (SB, KL, KP), pp. 41–52.