Travelled to:1 × New Zealand
Collaborated with:K.Lauenroth K.Pohl
Talks about:artifact (1) product (1) domain (1) model (1) engin (1) check (1) line (1)
Person: Simon Toehning
 DBLP: Toehning:Simon
 DBLP: Toehning:Simon
Contributed to:
Wrote 1 papers:
- ASE-2009-LauenrothPT #model checking #product line
- Model Checking of Domain Artifacts in Product Line Engineering (KL, KP, ST), pp. 269–280.












