Travelled to:2 × USA
Collaborated with:H.D.Schnurmann R.M.Peters E.R.Hsieh R.A.Rasmussen W.T.Davis
Talks about:test (2) generat (1) system (1) memori (1) delay (1) autom (1) chip (1) lsi (1)
Person: L. J. Vidunas
DBLP: Vidunas:L=_J=
Contributed to:
19841977Wrote 2 papers:
- DAC-1984-SchnurmannVP #automation #memory management #testing
- An automated system for testing LSI memory chips (HDS, LJV, RMP), pp. 454–458.
- DAC-1977-HsiehRVD #generative #testing
- Delay test generation (ERH, RAR, LJV, WTD), pp. 486–491.