Travelled to:1 × France
Collaborated with:H.Hashempour J.Dohmen B.Tasic B.Kruseman C.Hora Y.Xing
Talks about:test (2) industri (1) analogu (1) signal (1) reduct (1) orient (1) exampl (1) defect (1) devic (1) time (1)
Person: Maikel van Beurden
DBLP: Beurden:Maikel_van
Contributed to:
2011Wrote 1 papers:
- DATE-2011-HashempourDTKHBX #fault #industrial #reduction #testing
- Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example (HH, JD, BT, BK, CH, MvB, YX), pp. 371–376.