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Travelled to:
1 × France
Collaborated with:
H.Hashempour J.Dohmen B.Tasic B.Kruseman C.Hora Y.Xing
Talks about:
test (2) industri (1) analogu (1) signal (1) reduct (1) orient (1) exampl (1) defect (1) devic (1) time (1)

Person: Maikel van Beurden

DBLP DBLP: Beurden:Maikel_van

Contributed to:

DATE 20112011

Wrote 1 papers:

DATE-2011-HashempourDTKHBX #fault #industrial #reduction #testing
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example (HH, JD, BT, BK, CH, MvB, YX), pp. 371–376.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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