Travelled to:1 × France
2 × Germany
Collaborated with:M.Heiligers E.Alpaslan J.Dworak A.K.Majhi W.M.Heuvelman P.v.d.Wiel H.Hashempour J.Dohmen B.Tasic C.Hora M.v.Beurden Y.Xing
Talks about:test (3) defect (2) industri (1) silicon (1) discrep (1) between (1) analogu (1) signal (1) reduct (1) orient (1)
Person: Bram Kruseman
DBLP: Kruseman:Bram
Contributed to:
201120102006Wrote 3 papers:
- DATE-2011-HashempourDTKHBX #fault #industrial #reduction #testing
- Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example (HH, JD, BT, BK, CH, MvB, YX), pp. 371–376.
- DATE-2010-AlpaslanDKMHW #simulation
- NIM- a noise index model to estimate delay discrepancies between silicon and simulation (EA, JD, BK, AKM, WMH, PvdW), pp. 1373–1376.
- DATE-2006-KrusemanH #detection #fault #on the
- On test conditions for the detection of open defects (BK, MH), pp. 896–901.