Travelled to:1 × USA
Collaborated with:K.C.Jr.
Talks about:approach (1) experi (1) design (1) comput (1) check (1) scan (1) rule (1) line (1)
Person: P. T. Chapman
DBLP: Chapman:P=_T=
Contributed to:
1984Wrote 1 papers:
- DAC-1984-ChapmanC #approach #case study #design #experience
- The scan line approach to design rules checking: Computational experiences (PTC, KCJ), pp. 235–241.