Travelled to:
1 × Germany
Collaborated with:
K.Ohtani H.Fujiwara
Talks about:
generat (2) fault (2) test (2) algorithm (1) method (1) stuck (1) delay (1) path (1) use (1)
Person: Satoshi Ohtake
DBLP: Ohtake:Satoshi
Contributed to:
Wrote 1 papers:
- DATE-2003-OhtakeOF #algorithm #fault #generative #testing #using
- A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms (SO, KO, HF), pp. 10310–10315.