Travelled to:
1 × France
1 × Germany
Collaborated with:
∅ P.Nordholz H.Grabinski D.Treytnar J.Otterstedt D.Niggemeyer U.Arz
Talks about:
test (2) interconnect (1) technolog (1) nanomet (1) hazard (1) core (1)
Person: T. W. Williams
DBLP: Williams:T=_W=
Contributed to:
Wrote 2 papers:
- DATE-1999-Williams #testing
- Testing in Nanometer Technologies (TWW), p. 5–?.
- DATE-1998-NordholzGTONAW #testing
- Core Interconnect Testing Hazards (PN, HG, DT, JO, DN, UA, TWW), pp. 953–954.