Travelled to:
1 × Germany
1 × USA
2 × France
Collaborated with:
M.Rüffer J.Otterstedt T.J.Bergfeld E.M.Rudnick J.Hilgenstock K.Herrmann P.Pirsch P.Nordholz H.Grabinski D.Treytnar U.Arz T.W.Williams
Talks about:
test (3) multiprocess (1) interconnect (1) processor (1) parametr (1) diagnost (1) system (1) signal (1) memori (1) hazard (1)
Person: Dirk Niggemeyer
DBLP: Niggemeyer:Dirk
Contributed to:
Wrote 4 papers:
- DATE-2000-BergfeldNR #embedded #testing #using
- Diagnostic Testing of Embedded Memories Using BIST (TJB, DN, EMR), pp. 305–309.
- DATE-1999-NiggemeyerR #parametricity #self
- Parametric Built-In Self-Test of VLSI Systems (DN, MR), p. 376–?.
- DAC-1998-HilgenstockHONP #multi #video
- A Video Signal Processor for MIMD Multiprocessing (JH, KH, JO, DN, PP), pp. 50–55.
- DATE-1998-NordholzGTONAW #testing
- Core Interconnect Testing Hazards (PN, HG, DT, JO, DN, UA, TWW), pp. 953–954.