Stem lssd$ (all stems)

3 papers:

DAC-1991-WuR #effectiveness #evaluation

Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits (DMW, CER), pp. 291–295.

DAC-1982-Saluja #fault #generative

An enhancement of lssd to reduce test pattern generation effort and increase fault coverage (KKS), pp. 489–494.

DAC-1981-HsuSB #fault #testing

Structured trace diagnosis for LSSD board testing — an alternative to full fault simulated diagnosis (FCH, PS, REB), pp. 891–897.