Stem lssd$ (all stems)
- DAC-1991-WuR #effectiveness #evaluation
- Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits (DMW, CER), pp. 291–295.
- DAC-1982-Saluja #fault #generative
- An enhancement of lssd to reduce test pattern generation effort and increase fault coverage (KKS), pp. 489–494.
- DAC-1981-HsuSB #fault #testing
- Structured trace diagnosis for LSSD board testing — an alternative to full fault simulated diagnosis (FCH, PS, REB), pp. 891–897.