Kewal K. Saluja
An enhancement of lssd to reduce test pattern generation effort and increase fault coverage
DAC, 1982.
@inproceedings{DAC-1982-Saluja, author = "Kewal K. Saluja", booktitle = "{Proceedings of the 19th Design Automation Conference}", doi = "10.1145/800263.809249", pages = "489--494", publisher = "{ACM/IEEE}", title = "{An enhancement of lssd to reduce test pattern generation effort and increase fault coverage}", year = 1982, }