Kewal K. Saluja
An enhancement of lssd to reduce test pattern generation effort and increase fault coverage
DAC, 1982.
@inproceedings{DAC-1982-Saluja,
author = "Kewal K. Saluja",
booktitle = "{Proceedings of the 19th Design Automation Conference}",
doi = "10.1145/800263.809249",
pages = "489--494",
publisher = "{ACM/IEEE}",
title = "{An enhancement of lssd to reduce test pattern generation effort and increase fault coverage}",
year = 1982,
}











