Wai Kuan Yip, Lim Chun Chew, Wen Jau Lee
Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing
CASE, 2008.
@inproceedings{CASE-2008-KuanCJ, author = "Wai Kuan Yip and Lim Chun Chew and Wen Jau Lee", booktitle = "{Proceedings of the Fourth International Conference on Automation Science and Engineering}", doi = "10.1109/COASE.2008.4626545", isbn = "978-1-4244-2022-3", pages = "236--241", publisher = "{IEEE}", title = "{Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing}", year = 2008, }