Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing
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Wai Kuan Yip, Lim Chun Chew, Wen Jau Lee
Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing
CASE, 2008.

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@inproceedings{CASE-2008-KuanCJ,
	author        = "Wai Kuan Yip and Lim Chun Chew and Wen Jau Lee",
	booktitle     = "{Proceedings of the Fourth International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2008.4626545",
	isbn          = "978-1-4244-2022-3",
	pages         = "236--241",
	publisher     = "{IEEE}",
	title         = "{Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing}",
	year          = 2008,
}

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