Travelled to:2 × USA
Collaborated with:W.J.Lee L.C.Chew K.G.Law
Talks about:sort (3) class (2) base (2) semiconductor (1) manufactur (1) threshold (1) forecast (1) process (1) screen (1) propos (1)
Person: Wai Kuan Yip
DBLP: Yip:Wai_Kuan
Contributed to:
20082007Wrote 2 papers:
- CASE-2008-KuanCJ #modelling
- Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing (WKY, LCC, WJL), pp. 236–241.
- CASE-2007-YipLL #process
- Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data (WKY, KGL, WJL), pp. 478–483.