Stem semiconductor$ (all stems)

80 papers:

CASE-2015-ForstnerM #optimisation #safety #using

Using simulation-based optimization to determine production strategies and safety stock levels in semiconductor supply chains (LF, LM), pp. 655–656.

DAC-2015-KashyapGS #design #reliability

Achieving power and reliability sign-off for automotive semiconductor designs (AK, SG, SS), p. 6.

CASE-2014-HoussemanDRP #reduction

Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing (SH, SDP, GRV, JP), pp. 780–785.

CASE-2014-KaoCC #performance #variability

Target setting with consideration of target-induced operation variability for performance improvement of semiconductor fabrication (YTK, SCC, CMC), pp. 774–779.

CASE-2014-PampuriSWJOM #process

Insight extraction for semiconductor manufacturing processes (SP, GAS, JW, ABJ, PGO, SFM), pp. 786–791.

CASE-2014-WangCG #algorithm #constraints #estimation #hybrid #multi #problem #scheduling

Hybrid estimation of distribution algorithm with multiple subpopulations for semiconductor manufacturing scheduling problem with limited waiting-time constraint (HKW, CFC, MG), pp. 101–106.

CASE-2014-WangW #algorithm #estimation #problem #scheduling #testing

Compact estimation of distribution algorithm for semiconductor final testing scheduling problem (SW, LW), pp. 113–118.

CASE-2014-WuCT #analysis #memory management #modelling #multi

Multistage semiconductor memory inventory model based on survival analysis (JZW, CFC, YCT), pp. 613–618.

CASE-2014-YugmaBDV #bibliography #integration #process #scheduling

Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook (CY, JB, SDP, PV), pp. 93–98.

DATE-2014-SchmidBMKSKMSR

III-V semiconductor nanowires for future devices (HS, BMB, KM, PDK, GS, SFK, PM, VS, HR), pp. 1–2.

CASE-2013-LiX #adaptation #learning

Off-line learning based adaptive dispatching rule for semiconductor wafer fabrication facility (LL, HX), pp. 1028–1033.

CASE-2013-QiaoMG #algorithm #data-driven #scheduling

Attribute selection algorithm of data-based scheduling strategy for semiconductor manufacturing (FQ, YM, XG), pp. 410–415.

DATE-2013-JohnSVK

Semiconductor technologies for smart mobility management (RJ, MS, OV, KK), pp. 1749–1752.

CASE-2012-ChenF #analysis #rule-based

Treatment of missing values for association rule-based tool commonality analysis in semiconductor manufacturing (RHC, CMF), pp. 886–891.

CASE-2012-EhmP #research

Future research directions for mastering end-to-end semiconductor supply chains (HE, TP), pp. 641–645.

CASE-2012-KurzDP #using

Sampling Decision System in semiconductor manufacturing using Virtual Metrology (DK, CDL, JP), pp. 74–79.

CASE-2012-LiJJ #policy

A pull VPLs based release policy and dispatching rule for semiconductor wafer fabrication (YL, ZJ, WJ), pp. 396–400.

CASE-2012-LiLS #constraints #process

Dispatching rule considering time-constraints on processes for semiconductor wafer fabrication facility (LL, YFL, ZJS), pp. 407–412.

CASE-2012-PampuriSSLBN #multi #process

Multistep virtual metrology approaches for semiconductor manufacturing processes (SP, AS, GAS, CDL, AB, GDN), pp. 91–96.

CASE-2012-Rodriguez-VerjanTPDT

Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing (GRV, ET, JP, SDP, AT), pp. 920–923.

CASE-2012-RusslandEP #process #workflow

A workflow management system for cross-system processes in semiconductor supply chains (TR, HE, TP), pp. 635–640.

CASE-2012-SustoSPNB #approach

An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control (GAS, AS, SP, GDN, AB), pp. 358–363.

CASE-2012-YumKK #analysis #bibliography #perspective

Analysis of defective patterns on wafers in semiconductor manufacturing: A bibliographical review (BJY, JHK, SJK), pp. 86–90.

DATE-2012-Chian #industrial #modelling

New foundry models — accelerations in transformations of the semiconductor industry (MC), p. 2.

DATE-2012-XuYCJW #3d #performance

Efficient variation-aware EM-semiconductor coupled solver for the TSV structures in 3D IC (YX, WY, QC, LJ, NW), pp. 1409–1412.

CASE-2011-CaoPW #scheduling

A drum-buffer-rope based scheduling method for semiconductor manufacturing system (ZC, YP, YW), pp. 120–125.

CASE-2011-KurzKP #maintenance #network #using

Dynamic Maintenance in semiconductor manufacturing using Bayesian networks (DK, JK, JP), pp. 238–243.

CASE-2011-PampuriSFN #multi

Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing (SP, AS, GF, GDN), pp. 244–249.

CASE-2011-PampuriSLN #maintenance #predict

Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing (SP, AS, CDL, GDN), pp. 250–255.

DAC-2011-TorranceJ #reverse engineering #state of the art

The state-of-the-art in semiconductor reverse engineering (RT, DJ), pp. 333–338.

CASE-2010-AhnM #analysis #behaviour #clustering #modelling #tool support

Analysis of circular cluster tools: Transient behavior and semiconductor equipment models (YA, JRM), pp. 39–44.

CASE-2010-JingL #assembly #hybrid #scheduling

A MILP-based batch scheduling for two-stage hybrid flowshop with sequence-dependent setups in semiconductor assembly and test manufacturing (XJ, ZL), pp. 87–92.

CASE-2010-ParkM #evaluation #performance

Performance evaluation of deterministic flow lines: Redundant modules and application to semiconductor manufacturing equipment (KP, JRM), pp. 45–50.

CASE-2010-SchirruPN #maintenance #predict #process #robust

Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing (AS, SP, GDN), pp. 51–56.

CASE-2010-SchirruPN10a #multi #process #statistics

Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing (AS, SP, GDN), pp. 57–62.

CASE-2009-Morrison #clustering #modelling #process #tool support

Regular flow line models for semiconductor cluster tools: A case of lot dependent process times (JRM), pp. 561–566.

CASE-2009-SuCFTJKL #approach #identification #information management #novel #ontology

A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing (FHS, SCC, CMF, YJT, JJ, CPK, CYL), pp. 433–438.

DAC-2009-Welser #challenge #industrial #motivation #research

The semiconductor industry’s nanoelectronics research initiative: motivation and challenges (JW), pp. 298–300.

HCI-NT-2009-Liu #design #difference #gender #industrial #interface

Effects of Gender Difference on Emergency Operation Interface Design in Semiconductor Industry (HL), pp. 484–489.

CASE-2008-KangXWW #assembly #scheduling

A swarm-dynamic scheduling method for semiconductor assembly production line (QK, HX, LW, QW), pp. 91–96.

CASE-2008-KimSEP #component #scalability #self

Large scale self-assembly of crystalline semiconductor microcomponents onto plastic substrates via microfluidic traps (SSK, ES, JRE, BAP), pp. 967–970.

CASE-2008-KuanCJ #modelling

Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing (WKY, LCC, WJL), pp. 236–241.

CASE-2008-LiQ #scheduling

ACO-based scheduling for a single Batch Processing Machine in semiconductor manufacturing (LL, FQ), pp. 85–90.

CASE-2008-LiQ08a #performance #requirements #scheduling

The impact of the qual-run requirements of APC on the scheduling performance in semiconductor manufacturing (LL, FQ), pp. 242–246.

CASE-2008-Morrison #evolution

Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication (JRM), pp. 247–252.

DAC-2008-Vucurevich #3d

3-D semiconductor’s: more from Moore (TV), p. 664.

CASE-2007-GengJ #capacity #nondeterminism

Capacity Planning for Semiconductor Wafer Fabrication with Uncertain Demand and Capacity (NG, ZJ), pp. 100–105.

CASE-2007-HablaDMPE

A Short-Term Forecast Method for Demand Quantities in Semiconductor Manufacturing (CH, RD, LM, TP, HE), pp. 94–99.

CASE-2007-HablaMD #approach #capacity #finite

A Finite Capacity Production Planning Approach for Semiconductor Manufacturing (CH, LM, RD), pp. 82–87.

CASE-2007-JinBS #approach

A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime (TJ, FB, CHS), pp. 188–193.

CASE-2007-KwonM #framework #simulation

SysML-based Simulation Framework for Semiconductor Manufacturing (KSK, LFM), pp. 1075–1080.

CASE-2007-LiZL #multi

Semiconductor system with multiple closed-loops constrains (NL, LZ, QLL), pp. 484–488.

CASE-2007-Pillai #automation

Factory Automation as an Enabler in Leading-Edge Semiconductor Manufacturing (DP), p. 98–?.

CASE-2007-SchmidtR #queue

Queue time and x-factor characteristics for semiconductor manufacturing with small lot sizes (KS, OR), pp. 1069–1074.

CASE-2007-SunFSFCD #analysis #bibliography #paradigm

Decision Paradigms in the Semiconductor Supply Chain: A Survey and Analysis (YS, ALF, DLS, JWF, TEC, BMD), pp. 106–110.

CASE-2007-ZhangJ0 #multi #scheduling

Multi-criteria Dynamic Scheduling Methodology for Controlling a Semiconductor Wafer Fabrication System (HZ, ZJ, HH), pp. 213–218.

DAC-2007-Kwon #challenge #industrial

Perspective of the Future Semiconductor Industry: Challenges and Solutions (OHK).

CASE-2006-ChangC #industrial #multi

Manufacturability of Multivariate Applications in the Semiconductor Industry (JYCC, FTC), pp. 230–235.

CASE-2006-ChengSOYII #performance #scheduling

A fast rescheduling method in semiconductor manufacturing allowing for tardiness and scheduling stability (MC, MS, JO, MY, HI, KI), pp. 100–105.

CASE-2006-HuangC #online

On-Line Rescheduling for Semiconductor Manufacturing (HPH, TYC), pp. 106–111.

CASE-2006-NishiM #composition #optimisation #petri net #problem

Decomposition of Petri Nets for Optimization of Routing Problem for AGVs in Semiconductor Fabrication Bays (TN, RM), pp. 236–241.

CASE-2006-SweatNZZZ #assembly #capacity #multi

Multi-factory capacity planning in semiconductor assembly and test manufacturing with multiple-chip products (SS, SN, MTZ, ZZ, LZ), pp. 247–252.

CASE-2006-WangQW #multi #optimisation #scheduling

Scheduling Semiconductor Wafer Fabrication with Optimization of Multiple objectives (ZW, FQ, QW), pp. 253–258.

CASE-2005-ChangC #industrial #requirements

Engineering-chain requirements for semiconductor industry (JYCC, FTC), pp. 381–386.

CASE-2005-ChangLJ #detection #fault #network #using

Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection (CYC, SYL, MJ), pp. 301–306.

CASE-2005-HungHWCLH #collaboration #framework

A secure collaborative e-diagnostics framework for semiconductor factories (MHH, FYH, TLW, FTC, RL, TH), pp. 185–190.

CASE-2005-ZhangFZ #assembly #capacity #modelling #multi #workflow

Dynamic capacity modeling with multiple re-entrant workflows in semiconductor assembly manufacturing (MTZ, JF, EZ), pp. 160–165.

CASE-2005-ZhangNML #configuration management #multi #optimisation

Multi-factory optimization enables kit reconfiguration in semiconductor manufacturing (MTZ, SN, MM, QL), pp. 105–112.

CASE-2005-ZhangZNZ

Production planning with joint resources usage semiconductor test manufacturing (ZZ, MTZ, SN, LZ), pp. 49–54.

DATE-2005-GillNWPG #design #detection #performance

An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories (BSG, MN, FGW, CAP, SLG), pp. 592–597.

DATE-2005-LiauS

Computational Intelligence Characterization Method of Semiconductor Device (EL, DSL), pp. 456–461.

DATE-2005-ZorianFWESGR #industrial #question

Semiconductor Industry Disaggregation vs Reaggregation: Who Will be the Shark? (YZ, BF, DW, JE, GS, MG, KNR), p. 572.

DATE-2003-Cuomo #challenge

Semiconductor Challenges (AC), pp. 10008–10009.

DATE-2002-Bricaud #how #question

IP Day: How to Choose Semiconductor IP? (PB), p. 17.

DATE-2002-Martin #embedded #how

How to Choose Semiconductor IP: Embedded Software (GM), p. 16.

DATE-2002-Phillips #embedded #how

How to Choose Semiconductor IP? — Embedded Processor (IP), p. 14.

KDD-2000-GardnerB #data mining #mining #problem

Data mining solves tough semiconductor manufacturing problems (MG, JB), pp. 376–383.

HCI-CC-1997-SchaabH #industrial

Application of Ergonomics Principles Within the Semiconductor Industry (JAS, MRH), pp. 707–710.

DAC-1991-WalkerKS #database #editing #process #representation #statistics

A Semiconductor Wafer Representation Database and Its Use in the PREDITOR Process Editor and Statistical Simulator (DMHW, CSK, AJS), pp. 579–584.

DAC-1977-Harlow #design #interactive

The open shop interactive mask design operation at harris semiconductor (JEHI), pp. 331–335.