An enhancement of lssd to reduce test pattern generation effort and increase fault coverage
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Kewal K. Saluja
An enhancement of lssd to reduce test pattern generation effort and increase fault coverage
DAC, 1982.

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@inproceedings{DAC-1982-Saluja,
	author        = "Kewal K. Saluja",
	booktitle     = "{Proceedings of the 19th Design Automation Conference}",
	doi           = "10.1145/800263.809249",
	pages         = "489--494",
	publisher     = "{ACM/IEEE}",
	title         = "{An enhancement of lssd to reduce test pattern generation effort and increase fault coverage}",
	year          = 1982,
}

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