Sunil K. Jain, Vishwani D. Agrawal
Test generation for MOS circuits using D-algorithm
DAC, 1983.
@inproceedings{DAC-1983-JainA,
acmid = "800642",
author = "Sunil K. Jain and Vishwani D. Agrawal",
booktitle = "{Proceedings of the 20th Design Automation Conference}",
isbn = "0-8186-0026-8",
pages = "64--70",
publisher = "{ACM/IEEE}",
title = "{Test generation for MOS circuits using D-algorithm}",
year = 1983,
}











