Andrea S. LaPaugh, Richard J. Lipton
Total stuct-at-fault testing by circuit transformation
DAC, 1983.
@inproceedings{DAC-1983-LaPaughL, acmid = "800748", author = "Andrea S. LaPaugh and Richard J. Lipton", booktitle = "{Proceedings of the 20th Design Automation Conference}", isbn = "0-8186-0026-8", pages = "713--716", publisher = "{ACM/IEEE}", title = "{Total stuct-at-fault testing by circuit transformation}", year = 1983, }