Switch Level Random Pattern Testability Analysis
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Mehmet A. Cirit
Switch Level Random Pattern Testability Analysis
DAC, 1988.

DAC 1988
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@inproceedings{DAC-1988-Cirit,
	acmid         = "285730.285826",
	author        = "Mehmet A. Cirit",
	booktitle     = "{Proceedings of the 25th Design Automation Conference}",
	pages         = "587--590",
	publisher     = "{ACM}",
	title         = "{Switch Level Random Pattern Testability Analysis}",
	year          = 1988,
}

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