Travelled to:1 × USA
Collaborated with:∅
Talks about:transistor (1) testabl (1) pattern (1) circuit (1) analysi (1) switch (1) random (1) level (1) size (1) cmos (1)
Person: Mehmet A. Cirit
DBLP: Cirit:Mehmet_A=
Contributed to:
19881987Wrote 2 papers:
- DAC-1988-Cirit #analysis #random #testing
- Switch Level Random Pattern Testability Analysis (MAC), pp. 587–590.
- DAC-1987-Cirit
- Transistor Sizing in CMOS Circuits (MAC), pp. 121–124.