Stem testabl$ (all stems)

141 papers:

DLT-2015-MasopustT #automaton #complexity #on the #testing

On the Complexity of k-Piecewise Testability and the Depth of Automata (TM, MT), pp. 364–376.

SEFM-2015-HanazumiM #on the #testing

On the Testability of Properties Patterns (SH, ACVdM), pp. 148–155.

SEKE-2015-XuA #component #testing

A JVM-based Testing Harness for Improving Component Testability (WX, OeA), pp. 421–426.

DAC-2014-MotamanG #array #robust #self #testing

Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays (SM, SG), p. 2.

DATE-2014-GinesL #pipes and filters #testing

Sigma-delta testability for pipeline A/D converters (AJG, GL), pp. 1–6.

STOC-2014-Yoshida #composition #invariant #theorem

A characterization of locally testable affine-invariant properties via decomposition theorems (YY), pp. 154–163.

SEKE-2014-OliveiraMGND #framework #source code #testing

An Extensible Framework to Implement Test Oracle for Non-Testable Programs (RAPO, AMM, VNG, FLSN, MED), pp. 199–204.

STOC-2013-BhattacharyyaFHHL #invariant

Every locally characterized affine-invariant property is testable (AB, EF, HH, PH, SL), pp. 429–436.

CIAA-J-2012-Crespi-ReghizziP13 #strict #testing

Strict Local Testability with Consensus Equals Regularity, and Other Properties (SCR, PSP), pp. 747–764.

DLT-2013-KlimaP #automaton

Alternative Automata Characterization of Piecewise Testable Languages (OK, LP), pp. 289–300.

ICALP-v1-2013-BhattacharyyaY #algebra

An Algebraic Characterization of Testable Boolean CSPs (AB, YY), pp. 123–134.

CIAA-2012-Crespi-ReghizziP #strict #testing

Strict Local Testability with Consensus Equals Regularity (SCR, PSP), pp. 113–124.

DLT-2012-KlimaP #automaton

Biautomata for k-Piecewise Testable Languages (OK, LP), pp. 344–355.

DAC-2011-ChungXZA #statistics #testing

Testability driven statistical path selection (JC, JX, VZ, JAA), pp. 417–422.

STOC-2011-NewmanS #graph

Every property of hyperfinite graphs is testable (IN, CS), pp. 675–684.

SEKE-2011-BadriT #analysis #control flow #dependence #empirical #testing

Empirical Analysis for Investigating the Effect of Control Flow Dependencies on Testability of Classes (MB, FT), pp. 475–480.

SAC-2011-Gonzalez-SanchezAGG #empirical #fault #locality #testing

An empirical study on the usage of testability information to fault localization in software (AGS, RA, HGG, AJCvG), pp. 1398–1403.

DAC-2010-KimK #3d #design #synthesis #testing

Clock tree synthesis with pre-bond testability for 3D stacked IC designs (TYK, TK), pp. 723–728.

WCRE-2010-Sabane #architecture #testing

Improving System Testability and Testing with Microarchitectures (AS), pp. 309–312.

DLT-J-2008-KlimaP10

Hierarchies of Piecewise Testable Languages (OK, LP), pp. 517–533.

SPLC-2010-CabralCR #product line #testing

Improving the Testing and Testability of Software Product Lines (IC, MBC, GR), pp. 241–255.

ICST-2010-Laurent #concept #formal method #process #testing #using #validation #verification

Using Formal Methods and Testability Concepts in the Avionics Systems Validation and Verification (V&V) Process (OL), pp. 1–10.

ICTSS-2010-FalconeFJMM

More Testable Properties (YF, JCF, TJ, HM, LM), pp. 30–46.

DAC-2009-KrishnaswamyMH #testing

Improving testability and soft-error resilience through retiming (SK, ILM, JPH), pp. 508–513.

ICALP-v2-2009-PlaceS #decidability

A Decidable Characterization of Locally Testable Tree Languages (TP, LS), pp. 285–296.

ICST-2009-Chowdhary #testing

Practicing Testability in the Real World (VC), pp. 260–268.

TestCom-FATES-2009-GuoDW #erlang #source code #testing

Applying Testability Transformations to Achieve Structural Coverage of Erlang Programs (QG, JD, NW), pp. 81–96.

DATE-2008-BrownTBP #automation #library #logic #testing

Automated Testability Enhancements for Logic Brick Libraries (JGB, BT, RDB, LTP), pp. 480–485.

STOC-2008-BenjaminiSS #graph

Every minor-closed property of sparse graphs is testable (IB, OS, AS), pp. 393–402.

STOC-2008-Meir #combinator

Combinatorial construction of locally testable codes (OM), pp. 285–294.

DLT-2008-KlimaP

Hierarchies of Piecewise Testable Languages (OK, LP), pp. 479–490.

IFL-2008-KoopmanPA #execution #semantics

An Executable and Testable Semantics for iTasks (PWMK, RP, PA), pp. 212–232.

SEKE-2008-GaoLCSX #approach #case study #component

Building Testable Components — a Systematic Approach and Its Experimental Study (JG, WRL, RC, RS, MX), pp. 715–722.

SAC-2008-KingRCQ #design #object-oriented #reuse #self

A reusable object-oriented design to support self-testable autonomic software (TMK, AER, PJC, BQM), pp. 1664–1669.

ICST-2008-LindstromOA #empirical #execution #realtime #testing

Testability of Dynamic Real-Time Systems: An Empirical Study of Constrained Execution Environment Implications (BL, AJO, SFA), pp. 112–120.

ICST-2008-MetsaKM #aspect-oriented #testing

Comparing Aspects with Conventional Techniques for Increasing Testability (JM, MK, TM), pp. 387–395.

LICS-2008-BojanczykSS

Piecewise Testable Tree Languages (MB, LS, HS), pp. 442–451.

DATE-2007-LinC #design

Testable design for advanced serial-link transceivers (ML, KT(C), pp. 695–700.

DATE-2007-WangY #fault #synthesis #testing

High-level test synthesis for delay fault testability (SJW, THY), pp. 45–50.

TAP-2007-OstroffT #requirements #specification

Testable Requirements and Specifications (JSO, FAT), pp. 17–40.

DATE-2006-BernasconiCDV #network #performance

Efficient minimization of fully testable 2-SPP networks (AB, VC, RD, TV), pp. 1300–1305.

STOC-2006-Shapira #all about #combinator #graph

A combinatorial characterization of the testable graph properties: it’s all about regularity (NA, EF, IN, AS), pp. 251–260.

ICSE-2006-Zhao #analysis #approach #testing

A new approach for software testability analysis (LZ), pp. 985–988.

STOC-2005-AlonS #graph

Every monotone graph property is testable (NA, AS), pp. 128–137.

DATE-v1-2004-FernandesSOT #probability #testing

A Probabilistic Method for the Computation of Testability of RTL Constructs (JMF, MBS, ALO, JPT), pp. 176–181.

DATE-v1-2004-MetraMO #design #fault #question #testing

Are Our Design for Testability Features Fault Secure? (CM, TMM, MO), pp. 714–715.

DATE-v1-2004-PadmanabanT #fault #identification #performance #using

Using BDDs and ZBDDs for Efficient Identification of Testable Path Delay Faults (SP, ST), pp. 50–55.

DATE-v2-2004-LaouamriA #network #protocol #testing #using

Enhancing Testability of System on Chips Using Network Management Protocols (OL, CA), pp. 1370–1371.

DATE-v2-2004-SunterOCJBEBB #standard #testing

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6 (SKS, AO, AC, NJ, DB, BE, CB, BB), pp. 1184–1191.

ICSM-2004-LamoreauxOP #process #testing

A Process for Improving Software Testability (TL, MOK, MP), p. 502.

SCAM-2004-BruntinkD #metric #object-oriented #predict #testing #using

Predicting Class Testability using Object-Oriented Metrics (MB, AvD), pp. 136–145.

CIAA-2004-XieLD #automaton #testing

Testability of Oracle Automata (GX, CL, ZD), pp. 331–332.

DATE-2003-OikonomakosZA #metric #online #self #synthesis #testing #using

Versatile High-Level Synthesis of Self-Checking Datapaths Using an On-Line Testability Metric (PO, MZ, BMAH), pp. 10596–10601.

DATE-2003-OmanaRM #parallel

High Speed and Highly Testable Parallel Two-Rail Code Checker (MO, DR, CM), pp. 10608–10615.

CIAA-2003-Trakhtman #complexity #testing

Reducing the Time Complexity of Testing for Local Threshold Testability (AT), pp. 141–149.

ASE-2002-OwenMC #finite #modelling #question #what

What Makes Finite-State Models More (or Less) Testable? (DO, TM, BC), pp. 237–240.

DATE-2002-Hoffmann #design #generative #testing

A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits (CH), pp. 197–204.

DATE-2002-VedulaA #analysis #functional #generative #named #testing

FACTOR: A Hierarchical Methodology for Functional Test Generation and Testability Analysis (VMV, JAA), pp. 730–734.

ICSM-2002-BinhDR #analysis #component #testing

Testability Analysis for Software Components (TBN, MD, CR), pp. 422–429.

SCAM-2002-Ghosh #concurrent #fault #metric #object-oriented #source code #testing #towards #using

Towards Measurement of Testability of Concurrent Object-Oriented Programs Using Fault Insertion: A Preliminary Investigation (SG), pp. 17–25.

CIAA-2002-Trahtman #algorithm #polynomial #testing

A Polynomial Time Algorithm for Left [Right] Local Testability (ANT), pp. 203–212.

CIAA-2002-Trahtman02a #testing

A Package TESTAS for Checking Some Kinds of Testability (ANT), pp. 228–232.

DAC-2001-RaahemifarA #detection #fault

Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits (KR, MA), pp. 313–316.

DATE-2001-NicoliciA #3d #design #testing #trade-off

Testability trade-offs for BIST RTL data paths: the case for three dimensional design space (NN, BMAH), p. 802.

CBSE-2000-Gao #challenge #component #testing

Component Testability and Component Testing Challenges (JG), p. 7.

DAC-2000-NouraniCP

Synthesis-for-testability of controller-datapath pairs that use gated clocks (MN, JC, CAP), pp. 613–618.

ISSTA-2000-WoodwardA #fault #testing

Testability, fault size and the domain-to-range ratio: An eternal triangle (MRW, ZAAK), pp. 168–172.

DAC-1999-KimHT #on the #self #synthesis

On ILP Formulations for Built-In Self-Testable Data Path Synthesis (HBK, DSH, TT), pp. 742–747.

DATE-1999-AntakiSXA #design #testing

Design For Testability Method for CML Digital Circuits (BA, YS, NX, SA), pp. 360–367.

DATE-1999-CarlettaNP #synthesis #testing

Synthesis of Controllers for Full Testability of Integrated Datapath-Controller Pairs (JC, MN, CAP), pp. 278–282.

DLT-1999-RuizG

Right and left strongly locally testable semigroups and languages (JR, PG), pp. 232–241.

WIA-1999-Trahtman #algorithm #automaton #finite #testing #verification

An Algorithm to Verify Local Threshold Testability of Deterministic Finite Automata (ANT), pp. 164–173.

TOOLS-EUROPE-1999-TraonDJ #component #self #testing

Self-Testable Components: From Pragmatic Tests to Design-for-Testability Methodology (YLT, DD, JMJ), pp. 96–107.

IWTCS-1999-BaumgartenH #bound #testing

Testability with Unbounded Testing Strategies (BB, OH), pp. 43–60.

DAC-1998-GhoshJB #analysis #testing

A BIST Scheme for RTL Controller-Data Paths Based on Symbolic Testability Analysis (IG, NKJ, SB), pp. 554–559.

DATE-1998-MetraFR

Highly Testable and Compact 1-out-of-n Code Checker with Single Output (CM, MF, BR), pp. 981–982.

DATE-1998-PomeranzR98a #using

Design-for-Testability for Synchronous Sequential Circuits using Locally Available Lines (IP, SMR), pp. 983–984.

DATE-1998-PrietoRGPHR #approach #design #fault #layout #predict #testing

An Approach to Realistic Fault Prediction and Layout Design for Testability in Analog Circuits (JAP, AR, IAG, EJP, JLH, AMDR), pp. 905–909.

FoSSaCS-1998-Matz #on the

On Piecewise Testable, Starfree, and Recognizable Picture Languages (OM), pp. 203–210.

CSMR-1998-YehL #analysis #data flow #metric #testing

Software Testability Measurements Derived from Data Flow Analysis (PLY, JCL), pp. 96–103.

IWTCS-1998-BaumgartenW #testing

Qualitative Notions of Testability (BB, HW), pp. 345–360.

DAC-1997-GhoshRJ #design #generative #testing

Hierarchical Test Generation and Design for Testability of ASPPs and ASIPs (IG, AR, NKJ), pp. 534–539.

EDTC-1997-DrechslerHSHB #testing

Testability of 2-level AND/EXOR circuits (RD, HH, HS, JH, BB), pp. 548–553.

EDTC-1997-FlottesPR #behaviour #testing

Analyzing testability from behavioral to RT level (MLF, RP, BR), pp. 158–165.

EDTC-1997-GuLKP #analysis #testing

A controller testability analysis and enhancement technique (XG, EL, KK, ZP), pp. 153–157.

EDTC-1997-HuangW #array #design #performance

High-speed C-testable systolic array design for Galois-field inversion (CTH, CWW), pp. 342–346.

EDTC-1997-PomeranzR97a #finite #on the #state machine #testing

On the use of reset to increase the testability of interconnected finite-state machines (IP, SMR), pp. 554–559.

WIA-1997-Trahtman #automaton #estimation #finite #order #precise #testing

A Precise Estimation of the Order of Local Testability of a Deterministic Finite Automaton (ANT), pp. 198–212.

DAC-1996-WagnerD #bibliography #perspective #synthesis #testing

High-Level Synthesis for Testability: A Survey and Perspective (KDW, SD), pp. 131–136.

DAC-1995-PomeranzR #logic #on the

On Synthesis-for-Testability of Combinational Logic Circuits (IP, SMR), pp. 126–132.

ICSM-1995-KhoshgoftaarSV #detection #testing

Detecting program modules with low testability (TMK, RMS, JMV), pp. 242–250.

ICSE-1995-BertolinoS #assessment #dependence #metric #testing #using

Using Testability Measures for Dependability Assessment (AB, LS), pp. 61–70.

DAC-1994-ChakrabartyH #named #testing

DFBT: A Design-for-Testability Method Based on Balance Testing (KC, JPH), pp. 351–357.

DAC-1994-PomeranzR #combinator #fault #scalability #using

Design-for-Testability for Path Delay Faults in Large Combinatorial Circuits Using Test-Points (IP, SMR), pp. 358–364.

DAC-1994-PotkonjakD #optimisation #resource management #testing #using

Optimizing Resource Utilization and Testability Using Hot Potato Techniques (MP, SD), pp. 201–205.

EDAC-1994-BeckerD #diagrams #functional #testing

Testability of Circuits Derived from Functional Decision Diagrams (BB, RD), p. 667.

EDAC-1994-BhatiaJ #behaviour #named #synthesis #testing

Genesis: A Behavioral Synthesis System for Hierarchical Testability (SB, NKJ), pp. 272–276.

EDAC-1994-HaberlK #interface #maintenance #standard

Self Testable Boards with Standard IEEE 1149.5 Module Test and Maintenance (MTM) Bus Interface (OFH, TK), pp. 220–225.

EDAC-1994-HellebrandW #self #synthesis

Synthesis of Self-Testable Controllers (SH, HJW), pp. 580–585.

EDAC-1994-HirechFGR #design #simulation #testing

A Redefinable Symbolic Simulation Technique to Testability Design Rules Checking (MH, OF, AG, EHR), p. 668.

EDAC-1994-JamoussiK #approach #evaluation #named #testing

M-Testability: An Approach for Data-Path Testability Evaluation (MJ, BK), pp. 449–455.

EDAC-1994-KimCL #refinement #synthesis #testing

A Stepwise Refinement Data Path Synthesis Procedure for Easy Testability (TK, KSC, CLL), pp. 586–590.

EDAC-1994-Rodriguez-MontanesF #analysis #fault #testing

Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability (RRM, JF), pp. 356–360.

DAC-1993-ChakrabortyAB #design #fault #testing

Design for Testability for Path Delay faults in Sequential Circuits (TJC, VDA, MLB), pp. 453–457.

DAC-1993-ChickermaneRBP

Non-Scan Design-for-Testability Techniques for Sequential Circuits (VC, EMR, PB, JHP), pp. 236–241.

DAC-1993-LeeJW #behaviour #synthesis

Behavioral Synthesis of Highly Testable Data Paths under the Non-Scan and Partial Scan Environments (TCL, NKJ, WW), pp. 292–297.

ICALP-1993-Wilke #algebra #testing

Algebras for Classifying Regular Tree Languages and an Application to Frontier Testability (TW), pp. 347–358.

SEKE-1993-BombanaBCFSZ #analysis #functional #testing

An Expert Solution to Functional Testability Analysis of VLSI Circuits (MB, GB, PC, FF, DS, GZ), pp. 263–265.

IWPTS-1993-PetrenkoDK #evaluation #on the #protocol #testing

On Evaluation of Testability of Protocol Structures (AP, RD, HK), pp. 111–124.

IWPTS-1993-VuongLC #communication #design #framework #protocol #testing

A Framework for the Design for Testability of Communication Protocols (STV, AAFL, STC), pp. 89–108.

DAC-1992-KimBCP #algorithm #named

APT: An Area-Performance-Testability Driven Placement Algorithm (SK, PB, VC, JHP), pp. 141–146.

DAC-1992-SarabiP #canonical #network #performance

Fast Exact and Quasi-Minimal Minimization of Highly Testable Fixed-Polarity AND/XOR Canonical Networks (AS, MAP), pp. 30–35.

DAC-1991-BeerelM #testing

Testability of Asynchronous Timed Control Circuits with Delay Assumptions (PAB, THYM), pp. 446–451.

DAC-1991-ChengDK #design #generative #robust #standard #synthesis #testing

Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology (KTC, SD, KK), pp. 80–86.

DAC-1991-ChiuP #design #synthesis #testing

A Design for Testability Scheme with Applications to Data Path Synthesis (SC, CAP), pp. 271–277.

DAC-1991-EschermannW #approach #finite #self #state machine #synthesis

A Unified Approach for the Synthesis of Self-Testable Finite State Machines (BE, HJW), pp. 372–377.

DAC-1991-Krasniewski #logic #performance #pseudo #synthesis #testing

Logic Synthesis for Efficient Pseudoexhaustive Testability (AK), pp. 66–72.

DAC-1991-PapachristouCH #design #self #synthesis

A Data Path Synthesis Method for Self-Testable Designs (CAP, SC, HH), pp. 378–384.

DAC-1991-WuL #fault #probability #testing

A Probabilistic Testability Measure for Delay Faults (WCW, CLL), pp. 440–445.

DAC-1990-ButlerM #design #fault #performance

The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design (KMB, MRM), pp. 673–678.

DAC-1990-Chakravarty #identification #on the

On Synthesizing and Identifying Stuck-Open Testable CMOS Combinational Circuits (extended abstract) (SC), pp. 736–739.

DAC-1990-DevadasK #logic #optimisation #robust #synthesis

Synthesis and Optimization Procedures for Robustly Delay-Fault Testable Combinational Logic Circuits (SD, KK), pp. 221–227.

DAC-1990-Ito #automation #testing

Automatic Incorporation of On-Chip Testability Circuits (NI), pp. 529–534.

DAC-1989-Ghewala #named #testing

CrossCheck: A Cell Based VLSI Testability Solution (TG), pp. 706–709.

DAC-1988-Cirit #analysis #random #testing

Switch Level Random Pattern Testability Analysis (MAC), pp. 587–590.

DAC-1988-GebotysE #design #synthesis #testing

VLSI Design Synthesis with Testability (CHG, MIE), pp. 16–21.

DAC-1988-MaoC #algorithm #generative #metric #named #self #testing #using

Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation (WM, MDC), pp. 591–596.

DAC-1988-WehnGCMR

A Defect-Tolerant and Fully Testable PLA (NW, MG, KC, PM, AR), pp. 22–33.

DAC-1986-LigthartAB #statistics #using

Design-for-testability of PLA’s using statistical cooling (MML, EHLA, FPMB), pp. 339–345.

DAC-1985-FungHK #compilation #design #testing

Design for testability in a silicon compilation environment (HSF, SH, RK), pp. 190–196.

DAC-1985-Wunderlich #analysis #named #probability #testing

PROTEST: a tool for probabilistic testability analysis (HJW), pp. 204–211.

DAC-1984-DasguptaGRWW #clustering #design #testing

Chip partitioning aid: A design technique for partitionability and testability in VLSI (SD, MCG, RAR, RGW, TWW), pp. 203–208.

DAC-1984-Trischler #automation #bibliography #design #generative #perspective #testing

An integrated design for testability and automatic test pattern generation system: An overview (ET), pp. 209–215.

DAC-1982-BassetS #design #testing #top-down

Top down design and testability of VLSI circuits (PB, GS), pp. 851–857.

DAC-1982-GoelM82a #analysis #interactive #testing

An interactive testability analysis program — ITTAP (DKG, RMM), pp. 581–586.

DAC-1982-Williams #design #testing

Design for testability (TWW), p. 9.

DAC-1980-GrasonN #design #generative #testing

Digital test generation and design for testability (JG, AWN), pp. 175–189.

ICALP-1980-LucaR #on the #testing

On Some Properties of Local Testability (AdL, AR), pp. 385–393.

DAC-1979-Grason #metric #testing

TMEAS, a testability measurement program (JG), pp. 156–161.

DAC-1977-EichelbergerW #design #logic #testing

A logic design structure for LSI testability (EBE, TWW), pp. 462–468.

DAC-1977-GodoyFB #automation #design #logic #testing

Automatic checking of logic design structures For compliance with testability ground rules (HCG, GBF, PSB), pp. 469–478.