Indradeep Ghosh, Masahiro Fujita
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams
DAC, 2000.
@inproceedings{DAC-2000-GhoshF, author = "Indradeep Ghosh and Masahiro Fujita", booktitle = "{Proceedings of the 37th Design Automation Conference}", doi = "10.1145/337292.337309", pages = "43--48", publisher = "{ACM}", title = "{Automatic test pattern generation for functional RTL circuits using assignment decision diagrams}", year = 2000, }