Juan Antonio Maestro, Pedro Reviriego
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
DAC, 2008.
@inproceedings{DAC-2008-MaestroR, author = "Juan Antonio Maestro and Pedro Reviriego", booktitle = "{Proceedings of the 45th Design Automation Conference}", doi = "10.1145/1391469.1391704", isbn = "978-1-60558-115-6", pages = "930--935", publisher = "{ACM}", title = "{Study of the effects of MBUs on the reliability of a 150 nm SRAM device}", year = 2008, }