Study of the effects of MBUs on the reliability of a 150 nm SRAM device
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Juan Antonio Maestro, Pedro Reviriego
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
DAC, 2008.

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@inproceedings{DAC-2008-MaestroR,
	author        = "Juan Antonio Maestro and Pedro Reviriego",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391704",
	isbn          = "978-1-60558-115-6",
	pages         = "930--935",
	publisher     = "{ACM}",
	title         = "{Study of the effects of MBUs on the reliability of a 150 nm SRAM device}",
	year          = 2008,
}

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