A novel fuzzy matching model for lithography hotspot detection
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Sheng-Yuan Lin, Jing-Yi Chen, Jin-Cheng Li, Wan-Yu Wen, Shih-Chieh Chang
A novel fuzzy matching model for lithography hotspot detection
DAC, 2013.

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@inproceedings{DAC-2013-LinCLWC,
	author        = "Sheng-Yuan Lin and Jing-Yi Chen and Jin-Cheng Li and Wan-Yu Wen and Shih-Chieh Chang",
	booktitle     = "{Proceedings of the 50th Annual Design Automation Conference}",
	doi           = "10.1145/2463209.2488817",
	isbn          = "978-1-4503-2071-9",
	pages         = "6",
	publisher     = "{ACM}",
	title         = "{A novel fuzzy matching model for lithography hotspot detection}",
	year          = 2013,
}

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