Vikas Chandra
Monitoring Reliability in Embedded Processors — A Multi-layer View
DAC, 2014.
@inproceedings{DAC-2014-Chandra, author = "Vikas Chandra", booktitle = "{Proceedings of the 51st Annual Design Automation Conference}", doi = "10.1145/2593069.2596682", isbn = "978-1-4503-2730-5", pages = "6", publisher = "{ACM}", title = "{Monitoring Reliability in Embedded Processors — A Multi-layer View}", year = 2014, }