Monitoring Reliability in Embedded Processors — A Multi-layer View
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Vikas Chandra
Monitoring Reliability in Embedded Processors — A Multi-layer View
DAC, 2014.

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@inproceedings{DAC-2014-Chandra,
	author        = "Vikas Chandra",
	booktitle     = "{Proceedings of the 51st Annual Design Automation Conference}",
	doi           = "10.1145/2593069.2596682",
	isbn          = "978-1-4503-2730-5",
	pages         = "6",
	publisher     = "{ACM}",
	title         = "{Monitoring Reliability in Embedded Processors — A Multi-layer View}",
	year          = 2014,
}

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