Vikas Chandra
Monitoring Reliability in Embedded Processors — A Multi-layer View
DAC, 2014.
@inproceedings{DAC-2014-Chandra,
author = "Vikas Chandra",
booktitle = "{Proceedings of the 51st Annual Design Automation Conference}",
doi = "10.1145/2593069.2596682",
isbn = "978-1-4503-2730-5",
pages = "6",
publisher = "{ACM}",
title = "{Monitoring Reliability in Embedded Processors — A Multi-layer View}",
year = 2014,
}











