Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion
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Juan M. Díez, Juan Carlos López
Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion
DATE, 2000.

DATE 2000
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@inproceedings{DATE-2000-DiezL,
	author        = "Juan M. Díez and Juan Carlos López",
	booktitle     = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2000.840854",
	isbn          = "0-7695-0537-6",
	pages         = "645--649",
	publisher     = "{IEEE Computer Society}",
	title         = "{Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion}",
	year          = 2000,
}

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