BibSLEIGH corpus
BibSLEIGH tags
BibSLEIGH bundles
BibSLEIGH people
Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
email twitter
Used together with:
test (8)
measur (6)
cmos (6)
chip (3)
circuit (3)

Stem iddq$ (all stems)

15 papers:

DATEDATE-2013-ChangWB #design
Process-variation-aware Iddq diagnosis for nano-scale CMOS designs — the first step (CLC, CHPW, JB), pp. 454–457.
DATEDATE-2008-StrakaMBK #aspect-oriented #metric #quality
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality (BS, HARM, JB, SK), pp. 1310–1315.
DACDAC-2007-KangKIAR #estimation #metric #online #reliability #using
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement (KK, KK, AEI, MAA, KR), pp. 358–363.
DACDAC-2001-RaahemifarA #detection #fault
Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits (KR, MA), pp. 313–316.
DATEDATE-2000-DiezL #metric
Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion (JMD, JCL), pp. 645–649.
DATEDATE-1999-RiusF #energy #testing
Exploring the Combination of IDDQ and iDDt Testing: Energy Testing (JR, JF), pp. 543–548.
DATEDATE-1998-Rodriguez-MontanesF #estimation
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs (RRM, JF), pp. 490–494.
DATEDATE-1998-StrakaMVS #metric
A Fully Digital Controlled Off-Chip IDDQ Measurement Unit (BS, HARM, JV, MS), pp. 495–500.
DATEDATE-1998-SvajdaSM #metric #named
IOCIMU — An Integrated Off-Chip IDDQ Measurement Unit (MS, BS, HARM), pp. 959–960.
DATEEDTC-1997-LaquaiRW #metric #performance #testing
A production-oriented measurement method for fast and exhaustive Iddq tests (BL, HR, HW), pp. 279–286.
DATEEDTC-1997-Sachdev #testing
Deep sub-micron IDDQ testing: issues and solutions (MS), pp. 271–278.
DATEEDTC-1997-StopjakovaM #monitoring #testing
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits (VS, HARM), pp. 266–270.
DATEEDTC-1997-SvajdaSM #monitoring
A monolithic off-chip IDDQ monitor (MS, BS, HARM), p. 629.
DATEEDAC-1994-Sachdev #logic #testing
Transforming Sequential Logic in Digital CMOS ICs for Voltage and IDDQ Testing (MS), pp. 361–365.
DACDAC-1991-ChakrabortyBBL #testing #using
Enhanced Controllability for IDDQ Test Sets Using Partial Scan (TJC, SB, RB, CJL), pp. 278–281.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.