Stem iddq$ (all stems)

15 papers:

DATE-2013-ChangWB #design

Process-variation-aware Iddq diagnosis for nano-scale CMOS designs — the first step (CLC, CHPW, JB), pp. 454–457.

DATE-2008-StrakaMBK #aspect-oriented #metric #quality

Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality (BS, HARM, JB, SK), pp. 1310–1315.

DAC-2007-KangKIAR #estimation #metric #online #reliability #using

Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement (KK, KK, AEI, MAA, KR), pp. 358–363.

DAC-2001-RaahemifarA #detection #fault

Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits (KR, MA), pp. 313–316.

DATE-2000-DiezL #metric

Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion (JMD, JCL), pp. 645–649.

DATE-1999-RiusF #energy #testing

Exploring the Combination of IDDQ and iDDt Testing: Energy Testing (JR, JF), pp. 543–548.

DATE-1998-Rodriguez-MontanesF #estimation

Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs (RRM, JF), pp. 490–494.

DATE-1998-StrakaMVS #metric

A Fully Digital Controlled Off-Chip IDDQ Measurement Unit (BS, HARM, JV, MS), pp. 495–500.

DATE-1998-SvajdaSM #metric #named

IOCIMU — An Integrated Off-Chip IDDQ Measurement Unit (MS, BS, HARM), pp. 959–960.

EDTC-1997-LaquaiRW #metric #performance #testing

A production-oriented measurement method for fast and exhaustive Iddq tests (BL, HR, HW), pp. 279–286.

EDTC-1997-Sachdev #testing

Deep sub-micron IDDQ testing: issues and solutions (MS), pp. 271–278.

EDTC-1997-StopjakovaM #monitoring #testing

CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits (VS, HARM), pp. 266–270.

EDTC-1997-SvajdaSM #monitoring

A monolithic off-chip IDDQ monitor (MS, BS, HARM), p. 629.

EDAC-1994-Sachdev #logic #testing

Transforming Sequential Logic in Digital CMOS ICs for Voltage and IDDQ Testing (MS), pp. 361–365.

DAC-1991-ChakrabortyBBL #testing #using

Enhanced Controllability for IDDQ Test Sets Using Partial Scan (TJC, SB, RB, CJL), pp. 278–281.