Sasikumar Cherubal, Abhijit Chatterjee
Test generation based diagnosis of device parameters for analog circuits
DATE, 2001.
@inproceedings{DATE-2001-CherubalC,
author = "Sasikumar Cherubal and Abhijit Chatterjee",
booktitle = "{Proceedings of the Sixth Conference on Design, Automation and Test in Europe}",
doi = "10.1145/367072.367831",
isbn = "0-7695-0993-2",
pages = "596--602",
publisher = "{ACM}",
title = "{Test generation based diagnosis of device parameters for analog circuits}",
year = 2001,
}