BibSLEIGH — Abhijit

Travelled to:

4 × France
5 × Germany
5 × USA

Collaborated with:

S.Cherubal G.Srinivasan S.Sen H.W.Choi A.V.Gomes R.K.Roy R.I.Hartley A.Goyal M.Swaminathan F.Taenzler Y.S.Dhillon A.U.Diril R.Voorakaranam P.Pant V.De N.Nagi J.A.Abraham D.Banerjee S.K.Devarakond N.Tzou D.Bhatta S.Hsiao V.Natarajan R.Senguttuvan S.Bhattacharya

Talks about:

circuit (8) test (8) use (7) system (4) jitter (4) analog (4) power (3) optim (3) base (3) decomposit (2)

Person: Abhijit Chatterjee

DBLP: Chatterjee:Abhijit

Contributed to:

2013

2009

2008

2006

2005

2004

2002

2001

1999

1997

1993

1990

Wrote 16 papers:

DAC-2013-BanerjeeDSC #adaptation #constraints #energy #performance #realtime: Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints (DB, SKD, SS, AC), p. 7.
DATE-2013-TzouBHC #bound #composition #using: Periodic jitter and bounded uncorrelated jitter decomposition using incoherent undersampling (NT, DB, SWH, AC), pp. 1667–1672.
DATE-2009-GoyalSC #novel #self: A novel self-healing methodology for RF Amplifier circuits based on oscillation principles (AG, MS, AC), pp. 1656–1661.
DAC-2008-SenNSC #adaptation #named #power management #process: Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems (SS, VN, RS, AC), pp. 492–497.
DATE-2008-ChoiC #testing #using: Digital bit stream jitter testing using jitter expansion (HWC, AC), pp. 1468–1473.
DATE-2006-SrinivasanTC #automation #low cost #multi #online #platform: Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms (GS, FT, AC), pp. 658–663.
DATE-2005-DhillonDC #analysis #optimisation: Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits (YSD, AUD, AC), pp. 288–293.
DATE-v1-2004-SrinivasanBCC #metric #performance #using: Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit (GS, SB, SC, AC), pp. 280–285.
DATE-2002-VoorakaranamCC #agile #framework #testing: A Signature Test Framework for Rapid Production Testing of RF Circuits (RV, SC, AC), pp. 186–191.
DATE-2001-CherubalC #generative #parametricity #testing: Test generation based diagnosis of device parameters for analog circuits (SC, AC), pp. 596–602.
DATE-1999-CherubalC #fault #functional #parametricity #using: Parametric Fault Diagnosis for Analog Systems Using Functional Mapping (SC, AC), p. 195–?.
DATE-1999-GomesC #testing #using: Minimal Length Diagnostic Tests for Analog Circuits using Test History (AVG, AC), pp. 189–194.
DAC-1997-PantDC #energy #logic #network #optimisation #power management #random: Device-Circuit Optimization for Minimal Energy and Power Consumption in CMOS Random Logic Networks (PP, VD, AC), pp. 403–408.
DAC-1993-ChatterjeeR #architecture #composition #multi #optimisation: An Architectural Transformation Program for Optimization of Digital Systems by Multi-Level Decomposition (AC, RKR), pp. 343–348.
DAC-1993-NagiCA #fault #named: DRAFTS: Discretized Analog Circuit Fault Simulator (NN, AC, JAA), pp. 509–514.
DAC-1990-ChatterjeeH #approach #clustering: A New Simultaneous Circuit Partitioning and Chip Placement Approach Based on Simulated Annealing (AC, RIH), pp. 36–39.