Travelled to:
2 × France
2 × Germany
Collaborated with:
A.Chatterjee R.Voorakaranam G.Srinivasan S.Bhattacharya
Talks about:
test (4) use (3) diagnosi (2) circuit (2) analog (2) transient (1) framework (1) strategi (1) signatur (1) parametr (1)
Person: Sasikumar Cherubal
DBLP: Cherubal:Sasikumar
Contributed to:
Wrote 4 papers:
- DATE-v1-2004-SrinivasanBCC #metric #performance #using
- Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit (GS, SB, SC, AC), pp. 280–285.
- DATE-2002-VoorakaranamCC #agile #framework #testing
- A Signature Test Framework for Rapid Production Testing of RF Circuits (RV, SC, AC), pp. 186–191.
- DATE-2001-CherubalC #generative #parametricity #testing
- Test generation based diagnosis of device parameters for analog circuits (SC, AC), pp. 596–602.
- DATE-1999-CherubalC #fault #functional #parametricity #using
- Parametric Fault Diagnosis for Analog Systems Using Functional Mapping (SC, AC), p. 195–?.