Reducing Test Application Time Through Test Data Mutation Encoding
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Sherief Reda, Alex Orailoglu
Reducing Test Application Time Through Test Data Mutation Encoding
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-RedaO,
	acmid         = "874346",
	author        = "Sherief Reda and Alex Orailoglu",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998303",
	isbn          = "0-7695-1471-5",
	pages         = "387--393",
	publisher     = "{IEEE Computer Society}",
	title         = "{Reducing Test Application Time Through Test Data Mutation Encoding}",
	year          = 2002,
}

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