Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee
A Signature Test Framework for Rapid Production Testing of RF Circuits
DATE, 2002.
@inproceedings{DATE-2002-VoorakaranamCC,
acmid = "874477",
author = "Ramakrishna Voorakaranam and Sasikumar Cherubal and Abhijit Chatterjee",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998268",
isbn = "0-7695-1471-5",
pages = "186--191",
publisher = "{IEEE Computer Society}",
title = "{A Signature Test Framework for Rapid Production Testing of RF Circuits}",
year = 2002,
}